Machine learning models for patent examination

Machine learning models for patent examination

This year, text classification remains one of the most attractive research topics in the field of NLP(Natural Language Processing). Due to the complexity of patent classification, Patent Examination is still inseparable from the examiners, which makes the efficiency of Patent Examination ineffici...

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Bibliographic Details
Main Author: Wang, Yanqing
Other Authors: Lihui CHEN
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2020
Subjects:
Engineering::Computer science and engineering::Computer systems organization::Computer-communication networks
Online Access:https://hdl.handle.net/10356/141313

Internet

https://hdl.handle.net/10356/141313

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