Data processing and analytics in L-I-V test of VCSEL
L-I-V test is commonly used in semiconductor industry to exam the wafer products’ quality. This test assesses every individual VCSEL (Vertical Cavity Surface Emitting Laser) on the wafer slice with some quantities showing its lasing characteristics when electrically supplied. A software named “LIVCa...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2020
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| Online Access: | https://hdl.handle.net/10356/145081 |