Defect-GAN : high-fidelity defect synthesis for automated defect inspection

Defect-GAN : high-fidelity defect synthesis for automated defect inspection

Automated defect inspection is critical for effective and efficient maintenance, repair, and operations in advanced manufacturing. On the other hand, automated defect inspection is often constrained by the lack of defect samples, especially when we adopt deep neural networks for this task. This pape...

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Bibliographic Details
Main Authors: Zhang, Gongjie, Cui, Kaiwen, Hung, Tzu-Yi, Lu, Shijian
Other Authors: School of Electrical and Electronic Engineering
Format: Conference Paper
Language:English
Published: 2021
Subjects:
Engineering::Computer science and engineering
Defect Inspection
Image Synthesis
Online Access:https://hdl.handle.net/10356/146285

Internet

https://hdl.handle.net/10356/146285

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