RGB speckle pattern interferometry for surface metrology

RGB speckle pattern interferometry for surface metrology

Digital speckle pattern interferometry (DSPI) has been widely used for surface metrology of optically rough surfaces. Single visible wavelength can provide high measurement accuracy, but it limits the deformation measurement range of the interferometer. Also, it is difficult to reveal the shape of a...

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Bibliographic Details
Main Authors: Upputuri, Paul Kumar, Rajendran, Praveenbalaji, Pramanik, Manojit
Other Authors: School of Chemical and Biomedical Engineering
Format: Conference Paper
Language:English
Published: 2021
Subjects:
Engineering::Bioengineering
RGB Interferometry
Speckles
Online Access:https://hdl.handle.net/10356/146553

Internet

https://hdl.handle.net/10356/146553

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