In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy

In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy

Various in-plane anisotropic properties are observed for the layered semiconducting transition metal dichalcogenide (TMD), rhenium disulfide (ReS2) due to its reduced symmetry. The understanding of these unique anisotropic behaviors in ReS2 will promote its applications in optoelectronics. In this w...

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Bibliographic Details
Main Authors: Wang, Ying Ying, Zhou, Jia Dong, Jiang, Jie, Yin, Ting Ting, Yin, Zhi Xiong, Liu, Zheng, Shen, Ze Xiang
Other Authors: School of Materials Science and Engineering
Format: Journal Article
Language:English
Published: 2021
Subjects:
Science::Physics
Engineering::Materials
Optical Anisotropy
Layered Semiconductors
Online Access:https://hdl.handle.net/10356/150403

Internet

https://hdl.handle.net/10356/150403

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