In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy
Various in-plane anisotropic properties are observed for the layered semiconducting transition metal dichalcogenide (TMD), rhenium disulfide (ReS2) due to its reduced symmetry. The understanding of these unique anisotropic behaviors in ReS2 will promote its applications in optoelectronics. In this w...
| Main Authors: | , , , , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2021
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| Online Access: | https://hdl.handle.net/10356/150403 |
| _version_ | 1811694625990115328 |
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| author | Wang, Ying Ying Zhou, Jia Dong Jiang, Jie Yin, Ting Ting Yin, Zhi Xiong Liu, Zheng Shen, Ze Xiang |
| author2 | School of Materials Science and Engineering |
| author_facet | School of Materials Science and Engineering Wang, Ying Ying Zhou, Jia Dong Jiang, Jie Yin, Ting Ting Yin, Zhi Xiong Liu, Zheng Shen, Ze Xiang |
| author_sort | Wang, Ying Ying |
| collection | NTU |
| description | Various in-plane anisotropic properties are observed for the layered semiconducting transition metal dichalcogenide (TMD), rhenium disulfide (ReS2) due to its reduced symmetry. The understanding of these unique anisotropic behaviors in ReS2 will promote its applications in optoelectronics. In this work, angle-resolved polarized optical contrast spectroscopy has proved to be an efficient, quantitative, and non-destructive method to probe the optical anisotropy in ReS2 flakes with different thicknesses. The contrast value of ReS2 displays the maximum intensity when the polarization of incident light is along the Re–Re chain direction, while the contrast shows the minimum value when the polarization is perpendicular. An empirical equation for in-plane anisotropic refractive index calculation has been proposed and the angle-resolved polarized optical contrasts of 1–3-layer ReS2 are calculated. The calculation results show good agreements with the experimental observations. This indicates that the proposed equation is indeed appropriate for the quantitative understanding of birefringence and dichroism in ReS2 flakes. Our results not only shed light on the identification of crystal axes in anisotropic materials by using angle-resolved polarized contrast spectroscopy, but also provide quantitative information about anisotropy in anisotropic materials such as ReS2. |
| first_indexed | 2024-10-01T07:10:33Z |
| format | Journal Article |
| id | ntu-10356/150403 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T07:10:33Z |
| publishDate | 2021 |
| record_format | dspace |
| spelling | ntu-10356/1504032023-02-28T19:40:57Z In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy Wang, Ying Ying Zhou, Jia Dong Jiang, Jie Yin, Ting Ting Yin, Zhi Xiong Liu, Zheng Shen, Ze Xiang School of Materials Science and Engineering School of Physical and Mathematical Sciences Science::Physics Engineering::Materials Optical Anisotropy Layered Semiconductors Various in-plane anisotropic properties are observed for the layered semiconducting transition metal dichalcogenide (TMD), rhenium disulfide (ReS2) due to its reduced symmetry. The understanding of these unique anisotropic behaviors in ReS2 will promote its applications in optoelectronics. In this work, angle-resolved polarized optical contrast spectroscopy has proved to be an efficient, quantitative, and non-destructive method to probe the optical anisotropy in ReS2 flakes with different thicknesses. The contrast value of ReS2 displays the maximum intensity when the polarization of incident light is along the Re–Re chain direction, while the contrast shows the minimum value when the polarization is perpendicular. An empirical equation for in-plane anisotropic refractive index calculation has been proposed and the angle-resolved polarized optical contrasts of 1–3-layer ReS2 are calculated. The calculation results show good agreements with the experimental observations. This indicates that the proposed equation is indeed appropriate for the quantitative understanding of birefringence and dichroism in ReS2 flakes. Our results not only shed light on the identification of crystal axes in anisotropic materials by using angle-resolved polarized contrast spectroscopy, but also provide quantitative information about anisotropy in anisotropic materials such as ReS2. Ministry of Education (MOE) Accepted version YYW and JJ gratefully acknowledge financial support by the Ministry of Science and Technology of the People’s Republic of China (grant number 2017YFD080120203) and the China Scholarship Council (201806125035). TTY and ZXS would like to acknowledge Ministry of Education (MOE) of Singapore for the funding of this research through the following grants, AcRF Tier 1 (reference no: RG103/16); AcRF Tier 1 (RG195/17); AcRF Tier 3 (MOE 2016-T3-1-006 (S)). JDZ and ZL acknowledge financial support by MOE Tier 2 (MOE 2015-T2-2-007, MOE 2015-T2-2- 043, MOE 2017-T2-2-136) and Tier 3 (MOE 2018-T3-1-002). 2021-05-24T05:25:33Z 2021-05-24T05:25:33Z 2019 Journal Article Wang, Y. Y., Zhou, J. D., Jiang, J., Yin, T. T., Yin, Z. X., Liu, Z. & Shen, Z. X. (2019). In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy. Nanoscale, 11(42), 20199-20205. https://dx.doi.org/10.1039/c9nr07502j 2040-3364 https://hdl.handle.net/10356/150403 10.1039/c9nr07502j 31617546 2-s2.0-85074378252 42 11 20199 20205 en RG103/16 RG195/17 MOE 2016-T3-1-006 (S) MOE 2015-T2-2-007 MOE 2015-T2-2- 043 MOE 2017-T2-2-136 MOE 2018-T3-1-002 Nanoscale © 2019 The Royal Society of Chemistry. All rights reserved. This paper was published in Nanoscale and is made available with permission of The Royal Society of Chemistry. application/pdf |
| spellingShingle | Science::Physics Engineering::Materials Optical Anisotropy Layered Semiconductors Wang, Ying Ying Zhou, Jia Dong Jiang, Jie Yin, Ting Ting Yin, Zhi Xiong Liu, Zheng Shen, Ze Xiang In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy |
| title | In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy |
| title_full | In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy |
| title_fullStr | In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy |
| title_full_unstemmed | In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy |
| title_short | In-plane optical anisotropy in ReS2 flakes determined by angle-resolved polarized optical contrast spectroscopy |
| title_sort | in plane optical anisotropy in res2 flakes determined by angle resolved polarized optical contrast spectroscopy |
| topic | Science::Physics Engineering::Materials Optical Anisotropy Layered Semiconductors |
| url | https://hdl.handle.net/10356/150403 |
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