Delayered IC image analysis with template‐based tanimoto convolution and morphological decision

Delayered IC image analysis with template‐based tanimoto convolution and morphological decision

Supervised machine learning techniques are being pursued for delayered Integrated Circuit (IC) image analysis. However, repetitive data labelling and model training are required for every image set with the supervised techniques. In view of the large scale of IC image set being analysed, techniques...

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Bibliografski detalji
Glavni autori: Cheng, Deruo, Shi, Yiqiong, Lin, Tong, Gwee, Bah Hwee, Toh, Kar‐Ann
Daljnji autori: School of Electrical and Electronic Engineering
Format: Journal Article
Jezik:English
Izdano: 2021
Teme:
Engineering::Electrical and electronic engineering::Integrated circuits
Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision
Hardware Security
Segmentation
Online pristup:https://hdl.handle.net/10356/152375

Internet

https://hdl.handle.net/10356/152375

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