Enhanced electric resistivity and dielectric energy storage by vacancy defect complex

Enhanced electric resistivity and dielectric energy storage by vacancy defect complex

The presence of uncontrolled defects is a longstanding challenge for achieving high electric resistivity and high energy storage density in dielectric capacitors. In this study, opposite to conventional strategies to suppress de- fects, a new approach, i.e. , constructing defects with deeper energy...

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Bibliographic Details
Main Authors: Pan, Hao, Feng, Nan, Xu, Xing, Li, Weiwei, Zhang, Qinghua, Lan, Shun, Liu, Yi-Qian, Sha, Haozhi, Bi, Ke, Xu, Ben, Ma, Jing, Gu, Lin, Yu, Rong, Shen, Yang, Wang, Renshaw Xiao, MacManus-Driscoll, Judith L., Chen, Chong-Lin, Nan, Ce-Wen, Lin, Yuan-Hua
Other Authors: School of Physical and Mathematical Sciences
Format: Journal Article
Language:English
Published: 2022
Subjects:
Science::Physics
Dielectric Energy Storage
Defect
Online Access:https://hdl.handle.net/10356/156689

Internet

https://hdl.handle.net/10356/156689

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