Studies of gallium nitride high electron mobility transistors (HEMTs)
Gallium Nitride (GaN) is a Group III/V wide bandgap nitride-based material that offer many unique properties. It not only offers higher breakdown strength, faster switching speed and lower on resistance, it significantly outperforms the traditional silicon-based device. These properties have been...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2022
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| Online Access: | https://hdl.handle.net/10356/157799 |
| _version_ | 1811688789295235072 |
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| author | Tie, Keven Guo Sheng |
| author2 | Ng Geok Ing |
| author_facet | Ng Geok Ing Tie, Keven Guo Sheng |
| author_sort | Tie, Keven Guo Sheng |
| collection | NTU |
| description | Gallium Nitride (GaN) is a Group III/V wide bandgap nitride-based material that offer many unique properties. It not only offers higher breakdown strength, faster switching speed and lower on resistance, it significantly outperforms the traditional silicon-based device.
These properties have been attracting attention of many engineering scientist and leaders of the commercial semiconductor industry. Also, with its properties, GaN is set to be in the forefront material in both existing and new applications.
In recent times, many breakthroughs have been made in producing powerful GaN devices that are never seen in market before because of its wide spectrum of applications.
In this report, GaN HEMTs will be further pushed to limits that are never seen before, namely introduction of new materials to the fabrication process, focusing on its compatibility to meet RF technology. Some transistors that are fabricated will be tested and analysed of its performance. |
| first_indexed | 2024-10-01T05:37:47Z |
| format | Final Year Project (FYP) |
| id | ntu-10356/157799 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:37:47Z |
| publishDate | 2022 |
| publisher | Nanyang Technological University |
| record_format | dspace |
| spelling | ntu-10356/1577992023-07-07T19:10:36Z Studies of gallium nitride high electron mobility transistors (HEMTs) Tie, Keven Guo Sheng Ng Geok Ing School of Electrical and Electronic Engineering EGING@ntu.edu.sg Engineering::Electrical and electronic engineering Gallium Nitride (GaN) is a Group III/V wide bandgap nitride-based material that offer many unique properties. It not only offers higher breakdown strength, faster switching speed and lower on resistance, it significantly outperforms the traditional silicon-based device. These properties have been attracting attention of many engineering scientist and leaders of the commercial semiconductor industry. Also, with its properties, GaN is set to be in the forefront material in both existing and new applications. In recent times, many breakthroughs have been made in producing powerful GaN devices that are never seen in market before because of its wide spectrum of applications. In this report, GaN HEMTs will be further pushed to limits that are never seen before, namely introduction of new materials to the fabrication process, focusing on its compatibility to meet RF technology. Some transistors that are fabricated will be tested and analysed of its performance. Bachelor of Engineering (Electrical and Electronic Engineering) 2022-05-23T12:05:54Z 2022-05-23T12:05:54Z 2022 Final Year Project (FYP) Tie, K. G. S. (2022). Studies of gallium nitride high electron mobility transistors (HEMTs). Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/157799 https://hdl.handle.net/10356/157799 en A2167-211 application/pdf Nanyang Technological University |
| spellingShingle | Engineering::Electrical and electronic engineering Tie, Keven Guo Sheng Studies of gallium nitride high electron mobility transistors (HEMTs) |
| title | Studies of gallium nitride high electron mobility transistors (HEMTs) |
| title_full | Studies of gallium nitride high electron mobility transistors (HEMTs) |
| title_fullStr | Studies of gallium nitride high electron mobility transistors (HEMTs) |
| title_full_unstemmed | Studies of gallium nitride high electron mobility transistors (HEMTs) |
| title_short | Studies of gallium nitride high electron mobility transistors (HEMTs) |
| title_sort | studies of gallium nitride high electron mobility transistors hemts |
| topic | Engineering::Electrical and electronic engineering |
| url | https://hdl.handle.net/10356/157799 |
| work_keys_str_mv | AT tiekevenguosheng studiesofgalliumnitridehighelectronmobilitytransistorshemts |