Surface analysis of semiconductors and simulation using Python
Reflection High Energy Electron Diffraction (RHEED) is a real time in situ analysis technique for the characterisation of semiconductor surfaces. RHEED involves a beam of electrons, between 8 and 20KeV, incident upon the surface of a crystal substrate at a glancing angle. The electrons are dif...
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| Formato: | Final Year Project (FYP) |
| Idioma: | English |
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Nanyang Technological University
2022
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| Acesso em linha: | https://hdl.handle.net/10356/158436 |