Surface analysis of semiconductors and simulation using Python

Reflection High Energy Electron Diffraction (RHEED) is a real time in situ analysis technique for the characterisation of semiconductor surfaces. RHEED involves a beam of electrons, between 8 and 20KeV, incident upon the surface of a crystal substrate at a glancing angle. The electrons are dif...

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Detalhes bibliográficos
Autor principal: Corray, Andre Mark
Outros Autores: Radhakrishnan K
Formato: Final Year Project (FYP)
Idioma:English
Publicado em: Nanyang Technological University 2022
Assuntos:
Acesso em linha:https://hdl.handle.net/10356/158436