Deep learning-based image analysis framework for hardware assurance of digital integrated circuits

Deep learning-based image analysis framework for hardware assurance of digital integrated circuits

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We propose a complete Artificial Intelligence (AI)/Deep Learning (DL)-based image analysis framework for hardware assurance of digital integrated circuits (ICs). Our aim is to examine and verify various hardware information by analyzing the Scanning Electron Microscope (SEM) images of an IC. In our...

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Bibliographic Details
Main Authors: Lin, Tong, Shi, Yiqiong, Shu, Na, Cheng, Deruo, Hong, Xuenong, Song, Jingsi, Gwee, Bah Hwee
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2022
Subjects:
Engineering::Electrical and electronic engineering
Hardware Assurance
Digital ICs
Online Access:https://hdl.handle.net/10356/159572

Internet

https://hdl.handle.net/10356/159572

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