Deep learning in optical metrology: a review

With the advances in scientific foundations and technological implementations, optical metrology has become versatile problem-solving backbones in manufacturing, fundamental research, and engineering applications, such as quality control, nondestructive testing, experimental mechanics, and biomedici...

Full beskrivning

Bibliografiska uppgifter
Huvudupphovsmän: Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian
Övriga upphovsmän: School of Computer Science and Engineering
Materialtyp: Journal Article
Språk:English
Publicerad: 2022
Ämnen:
Länkar:https://hdl.handle.net/10356/160720