A physics-based model for crystal orientation dictionary indexing by directional reflectance microscopy
Directional reflectance microscopy (DRM) is a new optical technique that enables grain orientation mapping in crystalline solids by capturing and analyzing light reflectance signals generated by chemically etched surfaces. Currently, orientation indexing by DRM relies on fitting the optical signals...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2022
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/162146 |