A novel fault diagnosis method of smart grids based on memory spiking neural P systems considering measurement tampering attacks

A novel fault diagnosis method of smart grids based on memory spiking neural P systems considering measurement tampering attacks

Cyber-attacks can tamper with measurement data from physical systems via communication networks of smart grids, which could potentially lead circuit breakers to trip creating a false fault in the absence of any faulty section. Accordingly, a fault diagnosis method should first determine whether a fa...

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Bibliographic Details
Main Authors: Wang, Tao, Liu, Wei, Cabrera, Luis Valencia, Wang, Peng, Wei, Xiaoguang, Zang, Tianlei
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2022
Subjects:
Engineering::Electrical and electronic engineering
Fault Diagnosis
Membrane Computing
Online Access:https://hdl.handle.net/10356/163876

Internet

https://hdl.handle.net/10356/163876

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