Single-event-latchup detection based on machine learning
In space, the radiation effects on electronic devices may lead to anomalies referred to as Single-Event-Effects (SEEs). The Single-Event-Latchup (SEL) is a type of SEE arising from heavy-ions striking semiconductor devices, and is characterized as a high-current abnormality. This abnormality causes...
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| Format: | Thesis-Master by Coursework |
| Language: | English |
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Nanyang Technological University
2023
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| Online Access: | https://hdl.handle.net/10356/164816 |