Machine learning based image analysis for surface defect inspection

Machine learning based image analysis for surface defect inspection

The progress in computer vision technology has significantly improved the reliability, effectiveness, and efficiency of defect detection. This is attributed to the availability of advanced optical illumination systems and appropriate image capturing devices that produce high-quality images. Addition...

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Bibliographic Details
Main Author: Lee, Yong Xian
Other Authors: Zheng Jianmin
Format: Final Year Project (FYP)
Language:English
Published: Nanyang Technological University 2023
Subjects:
Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision
Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
Online Access:https://hdl.handle.net/10356/165900

Internet

https://hdl.handle.net/10356/165900

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