Experimental study of the impact of process variation on Internal Latchup (ILU) in 130nm technologies and statistical data analysis for performance optimization
Semiconductor devices are the backbone of the technological revolution. There would be no digital devices without a chip. As such it is important to identify the root of device failures, such that they can be worked on to come up with the solution. When semiconductor devices were first invented, one...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2023
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| Online Access: | https://hdl.handle.net/10356/167330 |