Investigation of mechanical stress-induced failure in transfer-bonded vertically aligned carbon nanotube arrays

As society increasingly embraces the digital world, technological progress is inevitable. With the proliferation of technology, the demand for advanced electronic devices that are both high-performing and portable is rising. This presents a challenge in terms of protecting these devices from elec...

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Bibliographic Details
Main Author: Zhai, Yiming
Other Authors: Tay Beng Kang
Format: Final Year Project (FYP)
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/167396