Algorithmic feature detection and statistical analysis in scanning probe microscopy data
Scanning Probe Microscopy has seen various advancements in recent years in terms of its imaging resolution, allowing researchers to image surfaces and particles on the atomic level. However, despite these advancements, the data acquisition processes undertaken in various fields are highly based on u...
| প্রধান লেখক: | |
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| অন্যান্য লেখক: | |
| বিন্যাস: | Final Year Project (FYP) |
| ভাষা: | English |
| প্রকাশিত: |
Nanyang Technological University
2023
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| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | https://hdl.handle.net/10356/167521 |