Enhancing semiconductor device characterization with deep learning-based keypoint detection
The urgency to accelerate the development of electrical components due to the high demand for electronic devices in different applications has driven the implementation of automation in the research phase. Machine Learning (ML) and Artificial Intelligence (AI) have been utilized to boost and support...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2023
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| Online Access: | https://hdl.handle.net/10356/168299 |