Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern

Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern

Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwavelength particles on a surface. The method is based...

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Bibliographic Details
Main Authors: Chan, Eng Aik, Rendón-Barraza, Carolina, Wang, Benquan, Pu, Tanchao, Ou, Jun-Yu, Wei, Hongxin, Adamo, Giorgio, An, Bo, Zheludev, Nikolay I.
Other Authors: School of Physical and Mathematical Sciences
Format: Journal Article
Language:English
Published: 2023
Subjects:
Engineering::Nanotechnology
Nnanoparticle Counting
Nanoparticle Imaging
Online Access:https://hdl.handle.net/10356/169651

Internet

https://hdl.handle.net/10356/169651

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