Surface morphology evolution of N-polar GaN on SiC for HEMT heterostructures grown by plasma-assisted molecular beam epitaxy

The surface morphology evolution of N-polar GaN with growth time was investigated and compared with Ga-polar GaN. N-polar GaN directly grown on SiC substrates was found to have slower 3D-to-2D growth transformation and less coalescence than the Ga-polar counterpart, resulting in rougher surface morp...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों: Huo, Lili, Lingaparthi, Ravikiran, Dharmarasu, Nethaji, Radhakrishnan, K., Chan, Casimir
अन्य लेखक: School of Electrical and Electronic Engineering
स्वरूप: Journal Article
भाषा:English
प्रकाशित: 2023
विषय:
ऑनलाइन पहुंच:https://hdl.handle.net/10356/169937