Unsupervised graph-based image clustering for pretext distribution learning in IC assurance

Unsupervised graph-based image clustering for pretext distribution learning in IC assurance

Delayered integrated circuit (IC) image analysis is one of the most reliable approaches for the hardware assurance of ICs. Deep learning (DL) techniques have been proposed as an effective means to automate IC image analysis due to their high accuracy and efficiency, allowing for automated learning f...

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Bibliographic Details
Main Authors: Tee, Yee Yang, Hong, Xuenong, Cheng, Deruo, Lin, Tong, Shi, Yiqiong, Gwee, Bah Hwee
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2023
Subjects:
Engineering::Electrical and electronic engineering
Hardware Assurance
Feature Extraction
Online Access:https://hdl.handle.net/10356/171416

Internet

https://hdl.handle.net/10356/171416

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