Deep learning for defect detection

The increase in demand for technology because of mankind’s reliance on it has led to an increase in manufacturing output for Integrated Chips. Quality assurance of Integrated Chips cannot be understated as it directly affects the operability of the many devices we rely on. Although measures have bee...

全面介绍

书目详细资料
主要作者: Low, Edwin Xuan Hao
其他作者: Qian Kemao
格式: Final Year Project (FYP)
语言:English
出版: Nanyang Technological University 2023
主题:
在线阅读:https://hdl.handle.net/10356/171974