Deep learning for defect detection
The increase in demand for technology because of mankind’s reliance on it has led to an increase in manufacturing output for Integrated Chips. Quality assurance of Integrated Chips cannot be understated as it directly affects the operability of the many devices we rely on. Although measures have bee...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2023
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| Online Access: | https://hdl.handle.net/10356/171974 |