Achieving sub-micron resolution in X-ray computational tomography through fixture design
X-Ray Computational Tomography (XCT) is a form of non-destructive testing used to visualise components’ internal features and generate 2D images or 3D models of these components. XCT is an essential tool in the industry for failure analysis and quality control. The quality of scans can be sign...
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| フォーマット: | Final Year Project (FYP) |
| 言語: | English |
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Nanyang Technological University
2024
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| オンライン･アクセス: | https://hdl.handle.net/10356/177764 |