Achieving sub-micron resolution in X-ray computational tomography through fixture design
X-Ray Computational Tomography (XCT) is a form of non-destructive testing used to visualise components’ internal features and generate 2D images or 3D models of these components. XCT is an essential tool in the industry for failure analysis and quality control. The quality of scans can be sign...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2024
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| Online Access: | https://hdl.handle.net/10356/177764 |
| _version_ | 1811680362503340032 |
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| author | Sheik Muhammad Uwais Bin Ishaak |
| author2 | Upadrasta Ramamurty |
| author_facet | Upadrasta Ramamurty Sheik Muhammad Uwais Bin Ishaak |
| author_sort | Sheik Muhammad Uwais Bin Ishaak |
| collection | NTU |
| description | X-Ray Computational Tomography (XCT) is a form of non-destructive testing used to
visualise components’ internal features and generate 2D images or 3D models of these
components. XCT is an essential tool in the industry for failure analysis and quality
control. The quality of scans can be significantly improved by modifying and adjusting
the X-Ray source characteristics and the detector receiving the X-Ray beams.
However, doing so can be very costly and complex due to the different tradeoffs when
adjusting these characteristics. Improving the proximity of the sample to the source
and ensuring sample straightness can also improve the quality of the scanned image.
As such, the fixture holding the sample plays a crucial role in obtaining a higher
resolution scanned image.
This report provides an overview on the design process of the new fixture and how it
improves on the drawbacks on current fixtures. Experimental investigations were
conducted to investigate the effectiveness of the new fixture on the scanning process
in terms of resolution of the image and the straightness of the sample. |
| first_indexed | 2024-10-01T03:23:51Z |
| format | Final Year Project (FYP) |
| id | ntu-10356/177764 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T03:23:51Z |
| publishDate | 2024 |
| publisher | Nanyang Technological University |
| record_format | dspace |
| spelling | ntu-10356/1777642024-06-01T16:54:20Z Achieving sub-micron resolution in X-ray computational tomography through fixture design Sheik Muhammad Uwais Bin Ishaak Upadrasta Ramamurty School of Mechanical and Aerospace Engineering Huang Sheng uram@ntu.edu.sg; huangshengmy@hotmail.com Engineering Fixture design X-Ray Computational Tomography (XCT) is a form of non-destructive testing used to visualise components’ internal features and generate 2D images or 3D models of these components. XCT is an essential tool in the industry for failure analysis and quality control. The quality of scans can be significantly improved by modifying and adjusting the X-Ray source characteristics and the detector receiving the X-Ray beams. However, doing so can be very costly and complex due to the different tradeoffs when adjusting these characteristics. Improving the proximity of the sample to the source and ensuring sample straightness can also improve the quality of the scanned image. As such, the fixture holding the sample plays a crucial role in obtaining a higher resolution scanned image. This report provides an overview on the design process of the new fixture and how it improves on the drawbacks on current fixtures. Experimental investigations were conducted to investigate the effectiveness of the new fixture on the scanning process in terms of resolution of the image and the straightness of the sample. Bachelor's degree 2024-05-31T06:16:13Z 2024-05-31T06:16:13Z 2024 Final Year Project (FYP) Sheik Muhammad Uwais Bin Ishaak (2024). Achieving sub-micron resolution in X-ray computational tomography through fixture design. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/177764 https://hdl.handle.net/10356/177764 en A142 application/pdf Nanyang Technological University |
| spellingShingle | Engineering Fixture design Sheik Muhammad Uwais Bin Ishaak Achieving sub-micron resolution in X-ray computational tomography through fixture design |
| title | Achieving sub-micron resolution in X-ray computational tomography through fixture design |
| title_full | Achieving sub-micron resolution in X-ray computational tomography through fixture design |
| title_fullStr | Achieving sub-micron resolution in X-ray computational tomography through fixture design |
| title_full_unstemmed | Achieving sub-micron resolution in X-ray computational tomography through fixture design |
| title_short | Achieving sub-micron resolution in X-ray computational tomography through fixture design |
| title_sort | achieving sub micron resolution in x ray computational tomography through fixture design |
| topic | Engineering Fixture design |
| url | https://hdl.handle.net/10356/177764 |
| work_keys_str_mv | AT sheikmuhammaduwaisbinishaak achievingsubmicronresolutioninxraycomputationaltomographythroughfixturedesign |