Atomic-thin WS2 kirigami for bidirectional polarization detection
The assembly and patterning engineering in two-dimensional (2D) materials hold importance for chip-level designs incorporating multifunctional detectors. At present, the patterning and stacking methods of 2D materials inevitably introduce impurity instability and functional limitations. Here, the sp...
Main Authors: | , , , , , , , , , , , , |
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Other Authors: | |
Format: | Journal Article |
Language: | English |
Published: |
2024
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/180833 |