Adaptive machine learning for manufactured IC image analysis

Adaptive machine learning for manufactured IC image analysis

The hardware assurance of integrated circuits (ICs), which is concerned with ensuring the security and integrity of ICs, is of paramount importance today given the ubiquity and necessity of semiconductor devices worldwide. Circuit extraction via the analysis of integrated circuit (IC) images is one...

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Bibliographic Details
Main Author: Tee, Yee Yang
Other Authors: Gwee Bah Hwee
Format: Thesis-Doctor of Philosophy
Language:English
Published: Nanyang Technological University 2024
Subjects:
Computer and Information Science
Engineering
Machine learning
Image analysis
Hardware assurance
Image synthesis
Domain adaptation
Adversarial learning
Online Access:https://hdl.handle.net/10356/181526

Internet

https://hdl.handle.net/10356/181526

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