Characterization of III-V semiconductor materials using rocking curve simulations
A windows-based simulation program using Borland C++, named Dynamical Simulation of X-ray Rocking Curves (DSRC), has been developed to calculate high resolution rocking curves for epitaxial layer structures using the fundamental X-ray scattering equations of dynamical diffraction. A bottom-up approa...
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| Format: | Thesis |
| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/10356/19560 |