Integrated testing and algorithms for computer visual inspection of integrated circuits

An automated visual inspection system for Pre-Cap inspection of integrated circuits is presented. This system applys a proposed database-structural-feature technique to inspect wirebond patterns. Four algorithms, one on pre-inspection alignment, one each on inspection of "ball" bonds and &...

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Detaylı Bibliyografya
Yazar: Heng, Aik Swan.
Diğer Yazarlar: Lee, Brian Chang Leng
Materyal Türü: Tez
Dil:English
Baskı/Yayın Bilgisi: 2009
Konular:
Online Erişim:http://hdl.handle.net/10356/19823