Anisotropic conductive adhesives for micro joining in semiconductor interconnect applications

The main objective in this study was to identify the impact of material properties on reliability, so as to engineer highly reliable microelectronics assemblies.

Bibliographic Details
Main Author: Teo, Mary.
Other Authors: Mhaisalkar, Subodh Gautam
Format: Thesis
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/2499