Investigation and design of built-in self-test techniques for digital logic circuits

The report emphasizes on the design of testing techniques for digital circuits.

Bibliographic Details
Main Author:	Wong, Eddie M. C.
Other Authors:	School of Electrical and Electronic Engineering
Format:	Research Report
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Online Access:	http://hdl.handle.net/10356/2697

Internet

http://hdl.handle.net/10356/2697