Review and analysis of device characterization structures and methodologies used for mixed signal integrated circuits
This project focues on the evaluation of the various characterization techniques and test structure designs for both active and passive component used in deep sub-micron high frequency mixed signal (analog/digital) integrated circuits. Key device parameters and matching of both passive components (r...
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/3148 |