0.18 um DRAM product electrical failure analysis for prediction of physical defects
Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM).
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/3543 |