0.18 um DRAM product electrical failure analysis for prediction of physical defects
Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM).
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| Other Authors: | |
| Format: | Thesis |
| Published: |
2008
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| Online Access: | http://hdl.handle.net/10356/3543 |
| _version_ | 1811691543738712064 |
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| author | Tej Bahadur Megh Raj. |
| author2 | Krishnamachar Prasad |
| author_facet | Krishnamachar Prasad Tej Bahadur Megh Raj. |
| author_sort | Tej Bahadur Megh Raj. |
| collection | NTU |
| description | Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM). |
| first_indexed | 2024-10-01T06:21:34Z |
| format | Thesis |
| id | ntu-10356/3543 |
| institution | Nanyang Technological University |
| last_indexed | 2024-10-01T06:21:34Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/35432023-07-04T15:51:31Z 0.18 um DRAM product electrical failure analysis for prediction of physical defects Tej Bahadur Megh Raj. Krishnamachar Prasad School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Power electronics Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM). Master of Science (Microelectronics) 2008-09-17T09:31:59Z 2008-09-17T09:31:59Z 2004 2004 Thesis http://hdl.handle.net/10356/3543 Nanyang Technological University 131 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Power electronics Tej Bahadur Megh Raj. 0.18 um DRAM product electrical failure analysis for prediction of physical defects |
| title | 0.18 um DRAM product electrical failure analysis for prediction of physical defects |
| title_full | 0.18 um DRAM product electrical failure analysis for prediction of physical defects |
| title_fullStr | 0.18 um DRAM product electrical failure analysis for prediction of physical defects |
| title_full_unstemmed | 0.18 um DRAM product electrical failure analysis for prediction of physical defects |
| title_short | 0.18 um DRAM product electrical failure analysis for prediction of physical defects |
| title_sort | 0 18 um dram product electrical failure analysis for prediction of physical defects |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Power electronics |
| url | http://hdl.handle.net/10356/3543 |
| work_keys_str_mv | AT tejbahadurmeghraj 018umdramproductelectricalfailureanalysisforpredictionofphysicaldefects |