Technology prediction with semi-empirical compact modeling approach
The aim of this project is to explore the prediction of new CMOS technology parameters with the aid of a semi-empirical compact model that has been calibrated to the given technology. The compact model parameters will be extracted from a given technology data and, whenever possible, correlated to pr...
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/3732 |