Characterization of deep submicron MOSFET with ultra thin gate oxide

85 p.

Bibliographic Details
Main Author:	Sun, Quan.
Other Authors:	Wang Hong
Format:	Thesis
Published:	2010
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Online Access:	http://hdl.handle.net/10356/39121

Internet

http://hdl.handle.net/10356/39121