Flicker noise fluctuations in deep submicron MOSFETs

166 p.

Bibliographic Details
Main Author:	Chew, Johnny Kok Wai
Other Authors:	Yeo Kiat Seng
Format:	Thesis
Published:	2010
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Online Access:	https://hdl.handle.net/10356/39154

Internet

https://hdl.handle.net/10356/39154