Toughness characterization of DLC and Ti doped DLC

Abstract As DLC and DLC based ceramic thin films are increasingly finding their way in engineering applications, thin film toughness assessment becomes important. However, it has not been thoroughly explored. This project will give a systematical investigation into assessing the toughness of...

詳細記述

書誌詳細
第一著者: Tey, Xiang Wei.
その他の著者: Sam Zhang Shanyong
フォーマット: Final Year Project (FYP)
言語:English
出版事項: 2010
主題:
オンライン・アクセス:http://hdl.handle.net/10356/39689