Far field prediction of radiated emission from pcb using near-field measurement

This report presents a new near field to far field transformation by using a statistical model approach that has yet to be introduced in the EMC community. The report begins with the introduction of near field to far field transformation which includes the background, motivation, objectives and scop...

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Bibliographic Details
Main Author: Loo, Shin Yi.
Other Authors: See Kye Yak
Format: Final Year Project (FYP)
Language:English
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/10356/40583