Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials

Non Destructive Testing techniques are commonly used in many industrial applications for thickness mapping and flaw detection. This report investigates the use of conventional Ultrasonic Testing A and C scan methods (pulse echo technique)and V(z)technique to determine properties of materials with de...

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Bibliographic Details
Main Author: Lee, Jefferson Zhen Zhong.
Other Authors: Wong, Brian Stephen
Format: Final Year Project (FYP)
Language:English
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/10356/41485