Micro-deformation characterization of electronic packaging materials and assemblies

The continuing miniaturization of microelectronic assemblies and devices requires experimental micro-deformation analysis technique for material characterization and structure reliability analysis. This work investigates both theoretical aspects and practical applications of digital image correlatio...

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Bibliographic Details
Main Author: Sun, Yao Feng
Other Authors: Pang Hock Lye, John
Format: Thesis
Language:English
Published: 2010
Subjects:
Online Access:https://hdl.handle.net/10356/41563