Latchup characterization of submicrometer CMOS
The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method.
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/4163 |