Investigation of low temperature wafer bonding using intermediate layer

In this project, the sol-gel intermediate layer bonding is demonstrated to provide high bond strength at low temperature (such as 100 degree celsius).

Bibliographic Details
Main Author: Deng, Shusheng
Other Authors: Tan, Cher Ming
Format: Thesis
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/4209