Silicon nanowire characterization for fatigue and reliability
This final year project report mainly focus on a project that is in conjunction with A*STAR Institute of Microelectronics in performing a study on the silicon nanowire characterization for fatigue and reliability. The project encompass a background research on relevant mechanical and reliability...
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| Formato: | Final Year Project (FYP) |
| Lenguaje: | English |
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2011
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| Acceso en línea: | http://hdl.handle.net/10356/44973 |