Characterization of ultrathin gate dielectric films
This study reports on the effect of Fowler-Nordheim injection stress on the gate oxide above the channel and edge (gate/drain overlap) regions. Several methods for electrical characterization of the gate dielectric are used to study the types of charge trapping at the Si-SiO2 interface, channel and...
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/4596 |