Pattern classification of overlapping data using probabilistic neural network

159 p.

Bibliographic Details
Main Author:	Roy Irawan
Other Authors:	Mao Kezhi
Format:	Thesis
Published:	2011
Subjects:	DRNTU::Engineering::Electrical and electronic engineering
Online Access:	http://hdl.handle.net/10356/46786

Internet

http://hdl.handle.net/10356/46786