Application of low frequency noise in the study of VLSI electromigration
The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes.
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/4688 |