Application of low frequency noise in the study of VLSI electromigration
The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes.
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Published: |
2008
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/4688 |
| _version_ | 1824454143053398016 |
|---|---|
| author | Lim, Shin Yeh. |
| author2 | Tan, Cher Ming |
| author_facet | Tan, Cher Ming Lim, Shin Yeh. |
| author_sort | Lim, Shin Yeh. |
| collection | NTU |
| description | The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes. |
| first_indexed | 2025-02-19T03:17:37Z |
| format | Thesis |
| id | ntu-10356/4688 |
| institution | Nanyang Technological University |
| last_indexed | 2025-02-19T03:17:37Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/46882023-07-04T15:57:49Z Application of low frequency noise in the study of VLSI electromigration Lim, Shin Yeh. Tan, Cher Ming School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes. Master of Engineering 2008-09-17T09:56:38Z 2008-09-17T09:56:38Z 2002 2002 Thesis http://hdl.handle.net/10356/4688 Nanyang Technological University application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Microelectronics Lim, Shin Yeh. Application of low frequency noise in the study of VLSI electromigration |
| title | Application of low frequency noise in the study of VLSI electromigration |
| title_full | Application of low frequency noise in the study of VLSI electromigration |
| title_fullStr | Application of low frequency noise in the study of VLSI electromigration |
| title_full_unstemmed | Application of low frequency noise in the study of VLSI electromigration |
| title_short | Application of low frequency noise in the study of VLSI electromigration |
| title_sort | application of low frequency noise in the study of vlsi electromigration |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Microelectronics |
| url | http://hdl.handle.net/10356/4688 |
| work_keys_str_mv | AT limshinyeh applicationoflowfrequencynoiseinthestudyofvlsielectromigration |